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Michael Kaufman, Michael J. Kaufman is the Dean of the College of Applied Science and Engineering and a Professor in the George S. Ansell Department of Metallurgical and Materials Engineering (MME) at the Colorado School of Mines. He served as Professor and Head of the MME Department from 2010-2015, and as the Director of the Electron Microscopy Laboratory at Mines from 2007- 2015. From 2004-2007, he served as the chair of the Department of Materials Science and Engineering in the new College of Engineering at the University of North Texas. He also served as a faculty member in the Department of Materials Science and Engineering at the University of Florida from 1989 to 2004 and at the University of Washington from 1986 to 1989, and as a research metallurgist at the National Institute of Science and Technology from 1984 to 1986. His research interests are in the area of structureproperty-processing relationships in metals, intermetallics and composites with an emphasis on conventional and novel processing (liquid-solid and solid-solid) methods. \Most of his work involves using advanced characterization methods, primarily those involving electron microscopy, to correlate microstructure with physical and mechanical properties. He has directed research funded by many federal agencies and private companies and has mentored 29 PhD and 29 MS students thus far uring his career. He has been the Center Director of the NSF I/UCRC Center for Advanced Non-Ferrous Structural Alloys (CANFSA) since 2011. Dr. Kaufman received his PhD in Metallurgical Engineering from the University of Illinois in Urbana-Champaign. He has published over 135 archival papers, given numerous invited talks at national and international meetings and received various awards.

Advances in Electron Microscopy and Atom Probe Tomography for Materials Characterization

Michael Kaufman

Dean, College of Applied Science and Engineering
Professor, Metallurgical and Materials Engineering
Colorado School of Mines
Golden, CO 80401

Abstract
Since the advent of the transmission electron microscope in the 1930s, our ability to make advances in materials science has closely paralleled the developments in the materials characterization tools that we have at our disposal. The fact that we can now conduct both static and dynamic in-situ experiments at sub-nanometer resolution in different environments and in three dimensions has enabled us to “see” materials undergo all sorts of changes that influence their structure, properties and performance. Combined with advances in computational materials modeling and visualization as well as in the area of atomic-scale manufacturing, researchers are currently able to make more rapid advances in materials development than ever before. In this presentation, I will attempt to describe the state-of-the-art in both transmission electron microscopy and atom probe tomography relevant to the characterization of advanced structural and functional materials (metals, ceramics and polymers). Where possible, I will provide examples from the literature and from some of our work that illustrate the importance of these capabilities and the exciting developments in the world of materials characterization.